X-Ray Spectroscopy
X-ray spectroscopy is used to help researchers characterize materials and better understand the chemical and elemental properties of an object.
During x-ray spectroscopy, an x-ray beam is focused onto a sample. This bombardment of high-energy particles causes the studied object’s electrons to transition between energy levels. Various techniques can be utilized to measure these changes and identify the materials in question.
The materials being studied are often delicate and subject to x-ray damage after prolonged exposure. To help with quick data collection, fast imaging is essential. Sydor’s products were developed with this in mind. Browse our available soft x-ray detectors below.
Products
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Sydor Spectro CCD
For x-ray spectroscopy applications, such as Resonant Inelastic X-Ray Scattering (RIXS), the Sydor Spectro CCD would be the suggested detector The combination of the ultra-fine pixels and the tilted mechanics...
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Sydor Fast CCD
The Sydor Fast CCD is more than 100x faster than alternative soft x-ray CCDs and will acquire images at up to 120 fps. The ultra-thin depletion contact is ideal forenergies...
Resources
Datasheet
Sydor Fast CCD DatasheetVideo
Sydor Fast CCD VideoApplication Note
Spectro CCD for RIXS Application Note